Nanotech 2014 Vol. 1
Nanotech 2014 Vol. 1
Nanotechnology 2014: Graphene, CNTs, Particles, Films & Composites

Nanoscale Materials Characterization Chapter 6

Use of Single Particle Inductively Coupled Plasma Mass Spectrometry to Characterize a New Silver Nanoparticle Reference Material

Authors: K.E. Murphy, J. Liu, W.F. Guthrie, J.M. Gorham, J.E. Bonevich, A.J. Allen, M.R. Winchester, V.A. Hackley, R.I. MacCuspie

Affilation: National Institute of Standards and Technology, United States

Pages: 501 - 504

Keywords: single particle ICP-MS, silver nanoparticles, reference material, particle size, stability

In this study we use a conventional inductively coupled plasma mass spectrometer operated in single particle mode (spICP-MS) to simultaneously characterize the size distribution and dissolved silver fraction of a new candidate silver nanoparticle reference material (NIST RM8017). The candidate RM8017 was prepared as a lyophilized cake of PVP and nominally 75 nm AgNPs that can be reconstituted as a suspension by the addition of deionized water. Particle size distributions obtained via spICP-MS will be compared with transmission electron microscopy (TEM), atomic force microscopy (AFM), and ultra-small angle X-ray scattering (USAX) size measurements. Data on the stability of reconstituted RM8017 stored at 4 oC will be presented.

ISBN: 978-1-4822-5826-4
Pages: 552
Hardcopy: $209.95