Murphy K.E., Liu J., Guthrie W.F., Gorham J.M., Bonevich J.E., Allen A.J., Winchester M.R., Hackley V.A., MacCuspie R.I.
National Institute of Standards and Technology, US
Keywords: particle size, reference material, silver nanoparticles, single particle ICP-MS, stability
In this study we use a conventional inductively coupled plasma mass spectrometer operated in single particle mode (spICP-MS) to simultaneously characterize the size distribution and dissolved silver fraction of a new candidate silver nanoparticle reference material (NIST RM8017). The candidate RM8017 was prepared as a lyophilized cake of PVP and nominally 75 nm AgNPs that can be reconstituted as a suspension by the addition of deionized water. Particle size distributions obtained via spICP-MS will be compared with transmission electron microscopy (TEM), atomic force microscopy (AFM), and ultra-small angle X-ray scattering (USAX) size measurements. Data on the stability of reconstituted RM8017 stored at 4 oC will be presented.
Journal: TechConnect Briefs
Volume: 1, Nanotechnology 2014: Graphene, CNTs, Particles, Films & Composites
Published: June 15, 2014
Pages: 501 - 504
Industry sector: Advanced Materials & Manufacturing
Topic: Materials Characterization & Imaging
ISBN: 978-1-4822-5826-4