Authors: R.S. Dhar, D. Ban
Affilation: University of Waterloo, Canada
Pages: 428 - 431
Keywords: nanoscopic probing, atomic force microscopy, scanning voltage microcopy, quantum cascade laser
A nanoscopic probing technique to measure voltage drop across an operating device in cryogenic temperature condition has been developed and established. The cross section surface of the terahertz (THz) quantum cascade laser (QCL) was profiled to resolve the voltage variation.