Nanotech 2013 Vol. 1
Nanotech 2013 Vol. 1
Nanotechnology 2013: Advanced Materials, CNTs, Particles, Films and Composites (Volume 1)

Nanoscale Materials Characterization Chapter 1

Magnetic Resonance Force Microscopy using a Commercially Available SPM Unit

Authors: S. Won, J. Heo

Affilation: Korea Institute of Materials Science, Korea

Pages: 136 - 138

Keywords: MRFM, force detection, magnetic resonance, SPM, electron spin resonance

Magnetic resonance force microscopy (MRFM) is considered another as a novel scanning probe microscope (SPM) combined with conventional SPM and magnetic resonance imaging. Originally, MRFM is proposed as a means to improve detection sensitivity to the single-proton level. However, MRFM has not become a commercialized technology up to now, in contrast with atomic force microscope (AFM). All MRFMs working currently, including our MRFM, are home-made systems manufactured in unique ways. Therefore, there is still room for improvement in each of the components making up an MRFM device, and this kind of improvement is a very important right now, necessary for true application of this device in the field of nanotechnology. Also, assigning reliability to hardware is very important in the process of development of new technology. In this study, we propose a MRFM using a commercially available SPM unit. Also, we introduce a module for correcting the optical fiber-to-cantilever alignment.

ISBN: 978-1-4822-0581-7
Pages: 830
Hardcopy: $209.95