Authors: C.M. Lin, T.C. Yu, S.H. Lai, H.C. Ho, H.F. Weng, S.H. Wang, C.J. Chen
Affilation: Center for Measurement Standards, Industrial Technology Research Institute, Taiwan
Pages: 160 - 163
Keywords: nanoparticle size, measurement uncertainty, differential mobility analysis
This paper presents the measurement results and the uncertainty analysis for four batches of polystyrene latex (PSL) spheres with nominal sizes of 20 nm, 100 nm, 300 nm and 500 nm using the measurement system which differential mobility analysis (DMA) method is applied. The possible error sources are evaluated based on the DMA method and the measurement procedures. The resulting expanded uncertainties are 1.3 nm for the 20 nm particles and 13 nm for the 500 nm particles at 95% confidence interval.