Nanotech 2010 Vol. 1
Nanotech 2010 Vol. 1
Nanotechnology 2010: Advanced Materials, CNTs, Particles, Films and Composites

Nanoscale Materials Characterization Chapter 1

Evaluation of Uncertainty in Nanoparticle Size Measurement by Differential Mobility Analysis

Authors: C.M. Lin, T.C. Yu, S.H. Lai, H.C. Ho, H.F. Weng, S.H. Wang, C.J. Chen

Affilation: Center for Measurement Standards, Industrial Technology Research Institute, Taiwan

Pages: 160 - 163

Keywords: nanoparticle size, measurement uncertainty, differential mobility analysis

This paper presents the measurement results and the uncertainty analysis for four batches of polystyrene latex (PSL) spheres with nominal sizes of 20 nm, 100 nm, 300 nm and 500 nm using the measurement system which differential mobility analysis (DMA) method is applied. The possible error sources are evaluated based on the DMA method and the measurement procedures. The resulting expanded uncertainties are 1.3 nm for the 20 nm particles and 13 nm for the 500 nm particles at 95% confidence interval.

ISBN: 978-1-4398-3401-5
Pages: 976
Hardcopy: $189.95

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