Authors: N. Muñoz Aguirre, J.E. Rivera López, L. Martínez Pérez, P. Tamayo Meza
Affilation: Instituto Politecnico Nacional, Mexico
Pages: 122 - 124
Keywords: piezoelectric ZnO thin films, atomic force microscopy, c-AFM, nano-generator
Conductive Atomic Force Microscopy (c-AFM)  characterization was made on Aluminum doped ZnO thin films. Furthermore, to the electrical resistance associated to the surface of the film, was in series connected a load resistance as shown in Figure 1. With no voltage applied to the AFM tip, a voltage throughout the load resistance only generated by the atomic force tip-sample interaction, while the scanning is taking place , was measured and shown in Figure 2.
Nanotech Conference Proceedings are now published in the TechConnect Briefs