Nanotech 2009 Vol. 3
Nanotech 2009 Vol. 3
Nanotechnology 2009: Biofuels, Renewable Energy, Coatings, Fluidics and Compact Modeling

Workshop on Compact Modeling Chapter 9

1/f Noise Model for Double-Gate FinFET Biased in Weak Inversion

Authors: C-Q Wei, Y-Z Xiong, X. Zhou

Affilation: Nanyang Technological University, Singapore

Pages: 639 - 642

Keywords: 1/f noise, noise model, FinFET, double gate

1/f noise model of long channel lightly-doped FinFET biased in weak inversion has been described using Hooge’s theory. From the drain current equation and the channel conductance expression, the total number of carriers under the gates has been evaluated. This quantity is the main parameter needed to deduce the Hooge parameter αH in the subthreshold conduction. 1/f noise in n-channel double-gate FinFETs has been investigated. These transistors exhibit 1/f noise in agreement with Hooge’s theory when they are biased in weak inversion due to their volume inversion conduction behaviors.

ISBN: 978-1-4398-1784-1
Pages: 694
Hardcopy: $179.95

2015 & Newer Proceedings

Nanotech Conference Proceedings are now published in the TechConnect Briefs

NSTI Online Community