Martin P., Ghibaudo G.
CEA/LETI/MINATEC, FR
Keywords: compact model, EKV3, flicker noise, low temperature, MOSFET
Advanced compact models are mandatory for simulation of mixed analog-digital circuits working at low temperature (77-200 K). In this work, the 1/f noise model introduced in the EKV3 model is evaluated. This evaluation is performed on a dual gate oxide CMOS technology with 0.18 µm / 1.8 V and 0.35 µm / 3.3 V MOSFET transistors. Experimental results on low frequency noise at room temperature and at 77 K for both n-MOSFET and p-MOSFET are presented. The flicker noise model introduced in EKV3 allows to fit experimental data in a very wide range, from weak to strong inversion.
Journal: TechConnect Briefs
Volume: 3, Nanotechnology 2009: Biofuels, Renewable Energy, Coatings, Fluidics and Compact Modeling
Published: May 3, 2009
Pages: 636 - 638
Industry sector: Sensors, MEMS, Electronics
Topic: WCM - Compact Modeling
ISBN: 978-1-4398-1784-1