Nanotech 2009 Vol. 3
Nanotech 2009 Vol. 3
Nanotechnology 2009: Biofuels, Renewable Energy, Coatings, Fluidics and Compact Modeling

Workshop on Compact Modeling Chapter 9

PSP Model Equations Extension for Statistical Estimation of Leakage Current in Nanometer CMOS Technologies Considering Process Variations

Authors: C. D’Agostino, P. Flatresse, E. Beigne, M. Belleville

Affilation: STMicroelectronics, France

Pages: 620 - 623

Keywords: statistical, variability, PSP, CMOS

A novel analytical methodology is proposed for statistical leakage estimation of CMOS circuits considering statistical process variations. The goal of the proposed methodology is to obtain a time-efficient and accurate estimation of the PDF of the leakage current of a complete digital circuit, without using time consuming Monte-Carlo simulations. The methodology consists mainly in the integration of probability equations directly into the PSP model

ISBN: 978-1-4398-1784-1
Pages: 694
Hardcopy: $179.95

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