Authors: B.M. Kim, D.E. Adams, Q. Tran, Q. Ma, V. Rao
Affilation: Nanochip, Inc., United States
Pages: 289 - 290
Keywords: probe, R/W, charge, ferroelectricity, piezoelectricity
Probe storage with epitaxial ferroelectric PbZr0.2Ti0.8O3 (PZT) media [1, 2] is a promising technology for terabyte/inch2 storage devices because nanoscale and nonvolatile polarizations may be reversibly written and read by a scanning probe tip. Piezoresponse Force Microscopy (PFM)  is a popular Scanning Force Microscopy (SFM)-based polarization bit reading technique that relies on an optical setup of SFM with lock-in technique to read piezoresponse motion of ferroelectric domains. Compared to PFM, Scanning Probe Charge Reading Technique (SPCRT)  uses an exclusively electrical setup comprising a charge amplifier to read charge signals associated with ferroelectric domains. A variant mode of SPCRT implemented with lock-in technique is demonstrated here to resolve bit charge on PZT with nanoscale spatial resolution.  T. Tybell, C. H. Ahn, and J.-M. Triscone, Appl. Phys. Lett. 72(12), 1454 (1998)  B. M. Kim, D. E. Adams, Q. Tran, Q. Ma and V. Rao, Appl. Phys. Lett. 94(7), (2009). in press.
Nanotech Conference Proceedings are now published in the TechConnect Briefs