A Technique for Constructing RTS Noise Model Based on Statistical Analysis

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In this paper, a technique for constructing the RTS noise model based on the statistical analysis of the noise data obtained from the Schottky diode under different biases is introduced. The three RTS parameters: pulse amplitude, pulse width and pulse delay are very important, since the RTS noise model was built up based on the statistical distributions of these three parameters. From the comparisons of the distributions, it is shown that the difference between the modeled RTS and measured RTS is quite small, and this model is useful in generating noise data because it is closely matched to the measured noise.

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Journal: TechConnect Briefs
Volume: 3, Nanotechnology 2008: Microsystems, Photonics, Sensors, Fluidics, Modeling, and Simulation – Technical Proceedings of the 2008 NSTI Nanotechnology Conference and Trade Show, Volume 3
Published: June 1, 2008
Pages: 885 - 888
Industry sector: Sensors, MEMS, Electronics
Topic: Compact Modeling
ISBN: 978-1-4200-8505-1