Nanotech 2007 Vol. 4
Nanotech 2007 Vol. 4
Technical Proceedings of the 2007 NSTI Nanotechnology Conference and Trade Show, Volume 4

Nanoscale Characterization Chapter 1

Confocal Raman AFM, a powerful tool for the nondestructive characterization of heterogeneous materials

Authors: U. Schmidt, F. Vargas, M. Kress, T. Dieing, K. Weishaupt and O. Hollricher

Affilation: WITec GmbH, Germany

Pages: 48 - 51

Keywords: confocal, Raman, AFM, imaging

The Confocal Raman-AFM is a breakthrough in microscopy. It combines three measuring techniques in one instrument: a high resolution confocal optical microscope, an extremely sensitive Raman spectroscopy system, and an Atomic Force Microscope (AFM). Using this instrument, the high spatial and topographical resolution obtained with an AFM can be directly linked to the chemical information provided by confocal Raman spectroscopy. By simply rotating the microscope turret, the AFM is transformed into a confocal Raman microscope. With the confocal Raman microscope, it is possible to obtain Raman spectra from extremely small sample volumes and to collect high resolution Raman spectral images.

ISBN: 1-4200-6376-6
Pages: 768
Hardcopy: $139.95