Malinowski P., Makowski D., Jablonski G., Napieralski A.
Technical University of Lodz, PL
Keywords: cyclic redundancy check, Hamming codes, microelectronics, nanotechnology, neutron radiation, Single Event Effect, single event upset, state machine, Static Random Access Memory
This paper presents a design of a radiation tolerant readout system for an SRAM-based neutron detector. The radiation tolerance has been achieved on the system level by applying Error Detection and Correction schemes. The constructed system concerns using state machines immune to Single Event Upsets induced by neutron radiation.
Journal: TechConnect Briefs
Volume: 3, Technical Proceedings of the 2007 NSTI Nanotechnology Conference and Trade Show, Volume 3
Published: May 20, 2007
Pages: 248 - 251
Industry sector: Sensors, MEMS, Electronics
Topic: Sensors - Chemical, Physical & Bio
ISBN: 1-4200-6184-4