Authors: H. Kitsuki, Q. Ngo, M. Suzuki, K. Gleason, P. Wilhite, A.M. Cassell, C.R. Moylan, J. Li and C.Y. Yang
Affilation: Santa Clara University, United States
Pages: 384 - 387
Keywords: carbon nanofibers, current-induced breakdown, scanning transmission electron microscopy (STEM), thermal transport
Current-induced breakdown phenomena of carbon nanofibers (CNFs) for the development of carbon-based interconnects are investigated to reveal current-carrying capacity and reliability of CNF devices. Scanning transmission electron microscopy (STEM) techniques are developed to study the structural damage by current stress, including in-situ electrical measurement in STEM. The correlation between maximum current density and electrical resistivity confirms the importance of local Joule heating, showing strong coupling between electrical and thermal transport in CNFs.
Nanotech Conference Proceedings are now published in the TechConnect Briefs