Nanotech 2007 Vol. 1
Nanotech 2007 Vol. 1
Technical Proceedings of the 2007 NSTI Nanotechnology Conference and Trade Show, Volume 1

Nanostructured Materials and Devices Chapter 5

Current-induced Breakdown of Carbon Nanofibers Under Vacuum and Atmospheric Conditions

Authors: H. Kitsuki, Q. Ngo, M. Suzuki, K. Gleason, P. Wilhite, A.M. Cassell, C.R. Moylan, J. Li and C.Y. Yang

Affilation: Santa Clara University, United States

Pages: 384 - 387

Keywords: carbon nanofibers, current-induced breakdown, scanning transmission electron microscopy (STEM), thermal transport

Current-induced breakdown phenomena of carbon nanofibers (CNFs) for the development of carbon-based interconnects are investigated to reveal current-carrying capacity and reliability of CNF devices. Scanning transmission electron microscopy (STEM) techniques are developed to study the structural damage by current stress, including in-situ electrical measurement in STEM. The correlation between maximum current density and electrical resistivity confirms the importance of local Joule heating, showing strong coupling between electrical and thermal transport in CNFs.

ISBN: 1-4200-6182-8
Pages: 726
Hardcopy: $139.95