Nanotech 2006 Vol. 3
Nanotech 2006 Vol. 3
Technical Proceedings of the 2006 NSTI Nanotechnology Conference and Trade Show, Volume 3

Nano and Molecular Electronics and Photonics Chapter 1

Thermal Noise and Bit Error Rate Limits in Nanoscale Memories

Authors: L. Forbes, M. Mudrow and W. Wanalertlak

Affilation: oregon state university, United States

Pages: 78 - 81

Keywords: noise, error rates, nanoscale memories

Analysis of the effects of thermal noise in nanoscale memories is presented. A theoretical analysis of thermal noise is used to predict the number of bit errors per year caused by thermal noise.

ISBN: 0-9767985-8-1
Pages: 913
Hardcopy: $119.95

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