Ikonomov P.G., Ghantasala M.K.
Western Michigan University, US
Keywords: nanoparticles, simulation of forces, virtual reality
In this paper we propose a VR approach to track the nanoparticle movement using simulated forces. As a first step in this direction we have considered the representation of the interaction between nanoparticles and Atomic Force Microscope (AFM) tip. This involved the computation of both long and short-range forces. In particular, the forces considered in the simulation include Van der Waals, Lennard-Jones forces (non-contact), adhesive and capillary forces, repulsive contact forces, and frictional forces. These forces were calculated using standard equations and relationships provided in the recent literature. A resultant vector force calculated with MatLab is used as an input to the virtual reality software (EONReality) in the representation of particle movement.
The simulation of the movement of the nanoparticles by proposed virtual reality methods is different from other simulation techniques in the representation of force vectors, which ultimately cause the movement in a resultant direction.
In this case, the acting force vector of AFM cantilever tip is assumed to pass through the body of the nanoparticles, not necessarily it’s center, unlike the other simulation techniques. Further, we assumed that the acting vector produces a force against the sum of all the internal forces of the nanoparticles.
In summary this work present a Virtual Reality tool to manipulate nanoparticles in three dimensional space by imputing different forces (among the nanoparticles, substrate, and manipulator) calculated for a set of experimental conditions.
Journal: TechConnect Briefs
Volume: 1, Technical Proceedings of the 2006 NSTI Nanotechnology Conference and Trade Show, Volume 1
Published: May 7, 2006
Pages: 693 - 696
Industry sector: Advanced Materials & Manufacturing
Topic: Informatics, Modeling & Simulation
ISBN: 0-9767985-6-5