Nanotech 2005 Vol. 3
Nanotech 2005 Vol. 3
Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 3

Smart Sensors and Systems Chapter 7

The IAradSim – IA32 Architecture under a High Radiation Environment Simulator

Authors: B. Swiercz, D. Makowski and A. Napieralski

Affilation: Technical University of Lodz, Poland

Pages: 411 - 414

Keywords: single event upset, total ionising dose, radiation environment, IA-32 architecture, fault tolerant system, hardened

Systems, which were designed for military or space applications, very often are exposed to increased radiation. The problem of designing hardened systems is very important for modern physics. The physics experiences design in linear accelerators and synchrotrons need measurements and control devices, which are under radiation impact. This paper highlights the application, which allows testing and observing systems intended to be used in a radioactive environment. The main aim of IAradSim is to reduce costs of research of hardened and fault tolerant systems.

ISBN: 0-9767985-2-2
Pages: 786
Hardcopy: $109.95

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