Nanotech 2005 Vol. 3
Nanotech 2005 Vol. 3
Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 3

Computational Methods, Numerics and Software Tools Chapter 10

Long-Wavelength Approximation Theory of Light Reflection from Nanoscale Anisotropic Layered Media

Authors: P. Adamson

Affilation: University of Tartu, Estonia

Pages: 664 - 667

Keywords: nanoscale layered media, anisotropic nanofilms, reflection theory, optical diagnostics

Nanoscale anisotropic thin films and multilayers are of most interest in surface science and nanotechnology. A widespread way to probe nanometric layers is to employ optical reflection methods. But the use of exact equations to resolve the inverse problem; i.e., to determine the parameters of layered structures from reflection characteristics, is rather complicated. A purpose of this paper is to investigate the reflection characteristics in the long-wavelength limit for an n-layer system of ultrathin anisotropic dielectric films on isotropic homogeneous substrates. We show that the accuracy of the long-wavelength approximation for nanoscopic anisotropic multilayers is quite satisfactory: if the maximum value of thickness over wavelength comprises a few hundredths then the errors of approximate formulas do not exceed a few percent. The most useful feature of obtained approximate expressions is that they are simply invertible, allowing a direct calculation of the parameters of ultrathin layers.

ISBN: 0-9767985-2-2
Pages: 786
Hardcopy: $109.95

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