Nanotech 2005 Vol. 2
Nanotech 2005 Vol. 2
Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 2

Inorganic Nanowires and Metallic Nano Structures Chapter 10

Conductivity of the Crystalline Boron Nanowires Measured in TEM

Authors: O. Lourie

Affilation: Gatan Inc., United States

Pages: 659 - 659

Keywords: boron, nanowires, conductivity, TEM

In this experiment we report on using in-situ STM-TEM system and EELS to characterize the electronic properties of the boron nanowires. We use low loss EELS approach to study the band structure and the dielectric response of these nanostructures. The STM-TEM system is used for a contact measurement of the conductivity of the individual Boron nanowire imaged in Transmission Electron Microscope (TEM). The in-situ EELS analysis has been completed with the structural information provided with HRTEM

ISBN: 0-9767985-1-4
Pages: 808
Hardcopy: $109.95

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