WCM 2005
WCM 2005
Technical Proceedings of the 2005 Workshop on Compact Modeling

WCM 2004 Invited Papers Chapter 3

Technology Limits and Compact Model for SiGe Scaled FETs
R.W. Dutton and C-H Choi
Stanford, US

Ballistic MOS Model (BMM) Considering Full 2D Quantum Effects
Z. Yu, D. Zhang and L. Tian
Tsinghua University, CN

Recent Enhancements of MOS Model 11
R. van Langevelde, A.J. Scholten and D.B.M. Klaassen
Philips Research Laboratories, NL

Noise Modeling with HiSIM Based on Self-Consistent Surface-Potential Description
M. Miura-Mattausch, S. Hosokawa, D. Navarro, S. Matsumoto, H. Ueno, H.J. Mattausch, T. Ohguro, T. Iizuka, M. Taguchi, T. Kage, and S. Miyamoto
Hiroshima University, JP

The Development of Next Generation BSIM for Sub-100nm Mixed-Signal Circuit Simulation
X. Xi, J. He, M. Dunga, C-H Lin, B. Heyderi, H. Wan, M. Chan, A.M. Niknejad and C. Hu
University of California at Berkeley, US

Unified Regional Approach to Consistent and Symmetric DC/AC Modeling of Deep-Submicron MOSFETs
X. Zhou, S.B. Chiah, K. Chandrasekaran, K.Y. Lim, L. Chan and S. Chu
Nanyang Technological University, SG

Modeling and Characterization of Wire Inductance for High Speed VLSI Design
N.D. Arora and L. Song
Cadence Design Systems, US

R3, an Accurate JFET and 3-Terminal Diffused Resistor Model
C. McAndrew
Motorola, US

Advanced MOSFET Modeling for RF IC Design
Y. Cheng
Skyworks Solutions, US

RF Noise Models of MOSFETs- A Review
S. Asgaran and M. Jamal Deen
McMaster University, CA

Bias Dependent Modeling of Collector-Base Junction Effects in Bipolar Transistors
H. Tran and M. Schroter
University of Technology Dresden, DE

Quasi-2D Compact Modeling for Double-Gate MOSFET
M. Chan, T.Y. Man, J. He, X. Xi, C-H Lin, X. Lin, P.K. Ko, A.M. Niknejad and C. Hu
Hong Kong University of Science and Technology, HK

Compact, Physics-Based Modeling of Nanoscale Limits of Double-Gate MOSFETs
Q. Chen, L. Wang, R. Murali and J.D. Meindl
Georgia Institute of Technology, US

Floating Gate Devices: Operation and Compact Modeling
P. Pavan, L. Larcher and A. Marmiroli
Università di Modena e Reggio Emilia, IT

ISBN: 0-9767985-3-0
Pages: 412