WCM 2005
WCM 2005
Technical Proceedings of the 2005 Workshop on Compact Modeling

Invited Papers Chapter 1

Comparison of Surface Potential and Charge-based MOSFET Core Models

Authors: C. Galup-Montoro, M. Schneider, V.C. Pahim and R. Rios

Affilation: Universidade Federal de Santa Catarina, Brazil

Pages: 13 - 18

Keywords: surface potential, inversion charge, compact model, comparison

Since the next generation MOSFET model will be based on either surface potential or inversion charge, a comparison between the two approaches is timely. In this paper, we will analyze in some detail the fundamentals of the two approaches. We will compare the expressions for inversion charge and gate capacitance.

ISBN: 0-9767985-3-0
Pages: 412