Nanotech 2004 Vol. 3
Nanotech 2004 Vol. 3
Technical Proceedings of the 2004 NSTI Nanotechnology Conference and Trade Show, Volume 3

Nanoscale Electronics and Quantum Devices Chapter 2

Fault Detection and Diagnosis Techniques for Molecular Computing

Authors: M.B. Tahoori and S. Mitra

Affilation: Northeastern University, United States

Pages: 57 - 60

Keywords: molecular electronics, test, diagnosis, BIST, defect-tolerance, fault-tolerance, self-repair

Fault detection and diagnosis techniques that are essential for defect tolerance, fault tolerance and self-repair of molecular computing systems are discussed. These techniques enable robust molecular computing system design protected from manufacturing defects and run-time errors in the underlying hardware.

ISBN: 0-9728422-9-2
Pages: 561
Hardcopy: $79.95

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