Nanotech 2004 Vol. 2
Nanotech 2004 Vol. 2
Technical Proceedings of the 2004 NSTI Nanotechnology Conference and Trade Show, Volume 2

MEMS Modeling Chapter 6

Contact Force Models, including Electric Contact Deformation, for Electrostatically Actuated, Cantilever-Style, RF MEMS Switches

Authors: R.A. Coutu_Jr. and P.E. Kladitis

Affilation: Air Force Institute of Technology, United States

Pages: 219 - 222

Keywords: microelectromechanical systems, micro-switch, contact force, contact resistance

Electrostatically actuated, cantilever-style, metal contact, radio frequency (RF), microelectromechanical systems (MEMS) switches depend on having adequate contact force to achieve desired, low contact resistance. In this study, contact force equations that account for beam tip deflection and electric contact material deformation are derived. Tip deflection is modeled analytically using beam bending theory and contact material deformation is modeled as elastic, plastic, or elastic-plastic. Contact resistance predictions, based on Maxwellian theory and newly derived contact force equations, are compared to experimental results. Contact force predictions not considering tip deflection or material deformation overestimate contact force and result in underestimated contact resistance. Predictions based on the new contact force models agree with measurements.

ISBN: 0-9728422-8-4
Pages: 519
Hardcopy: $79.95

2015 & Newer Proceedings

Nanotech Conference Proceedings are now published in the TechConnect Briefs

NSTI Online Community