2008 NSTI Nanotechnology Conference and Trade Show - Nanotech 2008 - 11th Annual
Technical Conferences
Merck Corporate Needs
NanoInk Symposium
Nano Electronics & Photonics
Nano Fabrication
Sensors & Systems
Micro & Nano Fluidics
MSM - Modeling Microsystems
WCM - Compact Modeling
Nanostructured Materials & Devices
Soft Nanotechnologies & Applications
Nanoparticles in Soft Materials - Colloidal Systems
Polymer Nanotechnology
Carbon Nano Structures & Devices
Nano Particles & Applications
Nanostructured Surfaces and Interfaces
Nanoscale Characterization
Energy Technologies & Applications
Nanotech in Health, Environment & Society
ICCN - Nanoscale Modeling
Bio Nano Materials & Tissues
Bio Sensors & Diagnostics
Biomarkers & Nanoparticles
Cancer Diagnostics, Imaging & Treatment
Drug Delivery & Therapeutics
Nano Medicine
Nanotech to Neurology
Phage Nanobiotechnology
Clean Technology 2008
Industrial Impact Workshop
Confirmed Speakers
Program Committee

Partnering Events:

TechConnect Summit
Clean Technology 2008
Jürgen Keller

Jürgen Keller

Fraunhofer Institut für Zuverlässigkeit und Mikrointegration IZM
Micro Materials Center Berlin, Germany

Dr.-Ing. Jürgen Keller finished his studies in mechanical engineering at the University of Kaiserslautern in 1999, and continued studying for the PhD. In 2005, he received his PhD for a thesis produced in collaborative work at the Lehrstuhl Polymermaterialien at Brandenburg University of Technology Cottbus and the Fraunhofer Institute for Reliability and Micro Integration (IZM), Berlin. He has been with Fraunhofer IZM ever since and works on micro- and nanomechanical deformation measurement techniques for microelectronics and nanotechnology applications. For his work to improve reliability in micro- and nanotechnologies by means of nanodeformation analysis (nanoDAC), Juergen Keller received (together with his co-workers Bernd Michel and Diemar Vogel) the Joseph-von-Fraunhofer-Prize 2005, labelled “Reliable to the Nanometer”. In addition to his work for the Fraunhofer IZM he is managing director of the AMIC Angewandte Micro-Messtechnik GmbH, Berlin since 2005.

Chairing the special symposium on Nanoreliability.

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