2007 NSTI Nanotechnology Conference and Trade Show - Nanotech 2007 - 10th Annual

A Computationally Efficient Method for Evaluating Distortion in DG MOSFETs

R. Salazar, A. Ortiz-Conde and F.J. García Sánchez
Solid State Electronics Laboratory, VE

double gate MOSFET, independently driven, distortion

In this paper we have generalized the correlation between Integral Nonlinearity Function (INLF) and Total Harmonic Distortion (THD) of independently driven double -gate (IDDG) MOSFETs.

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Nanotech 2007 Conference Program Abstract


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