Authors: H. Fulara, M. Raju, S. Chaudhary, S.C. Kashyap, D.K. Pandya
Affilation: Inidan Institute of Technology Delhi, India
Pages: 133 - 136
Keywords: thin films, magnetism, sputtering
The work relates to the exploring the means of controlling the coercivities of the ferromagnetic thin films in a Magnetic Tunnel Junction Stack. Exchange bias route is a very powerful route in achieving this task. We intend to demonstrate this in the CoFeB(FM)-IrMn(AF) bilayers grown by sputtering technique.