Authors: I. Enculescu, E. Matei, V. Vasilache, C.M. Teodorescu
Affilation: National Institute of Materials Physics, Romania
Pages: 231 - 234
Keywords: diluted magnetic semiconductors, scanning electron microscopy, magneto-optical Kerr effect, X-ray photoelectron spectroscopy
Pure and cobalt-doped ZnO films were electrodeposited from zinc and cobalt nitrate aqueous solutions on platinum substrates and investigated by X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM), and magneto-optical Kerr effect (MOKE). X-ray photoelectron spectroscopy revealed a nearly stoichiometric ZnO doped with cobalt whose atomic percentage range between 11 % and 15 % (ratio Co:Zn). Co doping affects strongly the microstructure of the films, for low overpotentials (- 750 and - 800 mV). For samples deposited at the highest overpotential (- 850 mV) the microstructure is less affected, the Co content is the lowest and these samples exhibit room temperature ferromagnetism.