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 | Nanotech 2008 Vol. 1
Nanotechnology 2008: Materials, Fabrication, Particles, and Characterization - Technical Proceedings of the 2008 NSTI Nanotechnology Conference and Trade Show, Volume 1
Chapter 6: Characterization |
| | Nanoparticle characterization using light scattering technologies | | Authors: | R. Xu | | Affilation: | Beckman Coulter, Inc., US | | Pages: | 863 - 865 | | Keywords: | zeta potential, size, light scattering | | Abstract: | To size smaller particles, dynamic light scattering (DLS) that utilizes time variation of scattered light from suspended particles to obtain their hydrodynamic size distribution is the most popular technology. For measuring turbid samples with particle concentration as high as 40wt%, back scattering in DLS has been proven the best approach. Electrophoretic light scattering (ELS) can produce accurate and high resolution zeta potential results for particles in liquid. However, its current applications are limited to dilute samples. Since zeta potential of particles is heavily dependent on its medium, measurement performed in originally concentrated samples is a must in many applications. The latest progress in this technology is a novel invention (FST) that measures particles near a transparent electrode so dilution is not needed. Combining DLS with ELS, the new DelsaTMNano from Beckman Coulter can perform both size and zeta potential measurements for particles of 0.6 nm to 30 um in suspensions with 0.001% to 40wt% of solid concentration. | | ISBN: | 978-1-4200-8503-7 |
| Pages: | 1118 |
| Hardcopy: | $199.99 |
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