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Nanotech 2007 Vol. 4
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Technical Proceedings of the 2007 NSTI Nanotechnology Conference and Trade Show, Volume 4
Nanotech 2007 Vol. 4
Technical Proceedings of the 2007 NSTI Nanotechnology Conference and Trade Show, Volume 4
 
Chapter 1: Nanoscale Characterization
 

Application of Abductive Network and FEM to Predict the Stress-Strain Curve with strain hardening effect of Bulk Metals by Nanoindentation test

Authors:T.S. Yang, J.Z. Qiu and S.Y. Chang
Affilation:National Formosa University, TW
Pages:141 - 144
Keywords:nanoindentation, stress-strain curve, finite element analysis, abductive network
Abstract:Finite element method (FEM) has been widely used for numerical simulation of indentation tests on bulk material in order to analyze its deformation response and investigate the influence of indenter geometry, friction and material elastic and plastic properties. The purpose of the present work was to investigate the nanoindentation process by FEM of bulk materials such as pure copper, titanium, iron and so on, considering strain hardening effect of material. In order to verify the FEM simulation results of the mechanical parameters such as Young’s modulus, yield stress, strength coefficient and strain harden exponent, the experimental data are compared with the results of the current simulation. The abductive network was then applied to synthesize the data sets obtained from the numerical simulation. The predicted results of the mechanical properties from the prediction model are consistent with the results obtained from experiment quite well. After employing the predictive model can provide valuable references in prediction of the mechanical parameters after nanoindentation tests.
ISBN:1-4200-6376-6
Pages:768
Hardcopy:$199.99
 
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