| |
 | Nanotech 2007 Vol. 4
Technical Proceedings of the 2007 NSTI Nanotechnology Conference and Trade Show, Volume 4
Chapter 1: Nanoscale Characterization |
| | Determination of micro-structural properties with x-ray absorption fine structure | | Authors: | S.-W. Han, S.-H. Park, H.-J. Yu, E.-S. Jeong, S.-H. Kim, Y.-J. Kim and G.-C. Yi | | Affilation: | Chonbuk National University, KR | | Pages: | 9 - 12 | | Keywords: | XAFS, structures, disorder, nanoparticle, ZnO, nanorod | | Abstract: | We studied the structural properties of ZnO nanostructures with x-ray absorption fine structure (XAFS) to understand the growth mechanism of vertically aligned ZnO nanorods of the average diameter of 50 - 150 nm. The orientation-dependent XAFS measurements parallel and perpendicular to the c-axis of ZnO nanorods with lengths of 0.1, 0.2 and 1.0 microns showed different amount of disorder existing in the bond lengths. The disorder in ab-plane was greatly reduced, as the ZnO formed into nanorods. We also demonstrate that the lateral surface of the ZnO nanorods have oxygen-termination determined by the XAFS analysis. | | ISBN: | 1-4200-6376-6 |
| Pages: | 768 |
| Hardcopy: | $199.99 |
|
| Order: | Mail/Fax Form |
| Special: | 3 CD Set — 15% off with Free Shipping |
| Up | |
|
| Upcoming Events |
 |
 |
 |
 |
| nanoPRwire™ |
 |
| News Headlines |
 |
|
|
| |
| |
|
| | |
| |
|
|
