Nano Science and Technology Institute
Nanotech 2007 Vol. 4
Nanotech 2007 Vol. 4
Technical Proceedings of the 2007 NSTI Nanotechnology Conference and Trade Show, Volume 4

Chapter 1:

Nanoscale Characterization

-Quantitative Synchrotron Grazing Incidence X-ray Scattering and Reflectivity Analysis of Nano-structures and Patterns Supported with Substrates
 M. Ree, J. Yoon, K. Heo, K.S. Jin, S. Jin, B. Lee, I. Park, S.C. Choi, G. Kim, H. Kim, W. Oh, Y-H Park, Y. Hwang, J-S Kim, J. Kim, K-W Kim and T. Chang
 Pohang University of Science & Technology, KR
-3D structure of nano-scale materials by total x-ray scattering
 V. Petkov
 Central Michigan University, US
-Determination of micro-structural properties with x-ray absorption fine structure
 S.-W. Han, S.-H. Park, H.-J. Yu, E.-S. Jeong, S.-H. Kim, Y.-J. Kim and G.-C. Yi
 Chonbuk National University, KR
-Nanoparticle Formation in Supercritical Fluids – The World’s First Real Time In-situ Investigation
 H. Jensen, M. Bremholm, R.P. Nielsen, K.D. Joensen, Y-S Chen, J. Almer, E.G. Søgaard, B.B. Iversen and S.B. Iversen
 SCF-Technologies, DK
-Lattice Engineered Nanoparticles.
 P. Casey, C.J. Rossouw, A.B. Murphy and C. Bell
 Commonwealth Scientific and Research Organisation, AU
-Analytical Methods for Nanotechnology
 I.A. Mowat, J. Moskito, I Ward and A. Hartzell
 Evans Analytical Group, US
-How to SPION Glass Transitions
 M. Concha, S. DeLong, L. Radu, C. Kumar and P. Bidwell-Hanson
 University of New Orleans, US
-Near-Field Raman and Luminescence Spectroscopies to evidence chemical heterogeneity of surfaces with sub-wavelength spatial resolution.
 B. Humbert, J. Grausem, M. Dossot and S. Cremel
 LCPME UMR 7564 CNRS-UHP, FR
-Analysis of Interfacial Water Structure close to Mixed Langmuir Monolayers by Sum-Frequency Spectroscopy
 Z.S. Nickolov, D.W. Britt and J.D. Miller
 Drexel University, Drexel Nanotechnology Institute, US
-Correlated roughness in polymer film containing magnetic nanoparticles
 M.M. Abul Kashem, J. Perlich, L. Schulz, S.V. Roth and P. Müller-Buschbaum
 Technische Universität München, DE
-An All-Digital Cantilever Controller for MRFM and Scanned Probe Microscopy using a Combined DSP/FPGA Design
 D. de Roover, L.M. Porter II, A. Emami-Naeini, J.A. Marohn, S. Kuehn, S. Garner and D.D. Smith
 SC Solutions, Inc., US
-Highly sensitive Scanning Capacitance Microscope
 H. Tanbakuchi
 Agilent Technologies, US
-Confocal Raman AFM, a powerful tool for the nondestructive characterization of heterogeneous materials
 U. Schmidt, F. Vargas, M. Kress, T. Dieing, K. Weishaupt and O. Hollricher
 WITec GmbH, DE
-Nano Equipment and Materials for Electronics - Market Needs and Outlook
 L. Sheet
 SEMI, US
-The Casimir Force and quantum interaction between conducting macro-bodies at nanoscale distances
 V. Petrov, M. Petrov, V. Bryksin, J. Petter and T. Tschudi
 Darmstadt Technical University, DE
-Nanoscale Deformation Measurements for Reliability Assessment of MEMS and NEMS
 J. Keller, D. Vogel and B. Michel
 Fraunhofer Institute for Reliability and Microintegration (IZM), DE
-Effective Use of Focused Ion Beam (FIB) in Investigating Fundamental Mechanical Properties of Metals at the Nano-Scale.
 J.R. Greer and W.D. Nix
 Palo Alto Research Center, US
-Mechanical Properties of Polycrystalline 3C-SiC Heteroepitaxial Layers
 M. Pozzi, A.J. Harris, J.S. Burdess, K.K. Lee and R. Cheung
 Newcastle University, UK
-Understanding and utilizing molecular constraints in nanoscale material designs
 S. Sills and R.M. Overney
 Micron Technology, Inc., US
-Advanced CryoTEM and Tomography for Two- and Three-Dimensional Nano-Characterisation of Soft Matter
 E. Sourty, F. de Haas, P.M. Frederik, J. Loos, D.J. Stokes and D.H.W. Hubert
 FEI Company, NL
-Characterisation of Native-State Soft Matter using ‘Multi-Mode’ Electron Microscopy
 D.J. Stokes, E. Baken, B.H. Lich and D.H.W. Hubert
 FEI Company, NL
-Accommodation of Characterization Tools
 L. York
 Abbie Gregg, Inc., US
-The Impact of Advanced S/TEM on Atomic-Scale Characterisation and Analysis
 D.H.W. Hubert, B. Freitag and D.J. Stokes
 FEI Company, NL
-In-situ Gas Injection-Heating Atomic Resolution TEM for Nanomaterials
 X.F. Zhang
 Hitachi High Technologies America, Inc., US
-Image-based Nanocrystallography in Two and Three Dimensions with
 P. Moeck, R. Bjorge and P. Fraundorf
 Portland State University, US
-Characterisation of Electrical Fields of Buried Interdigitated Nanoscale Ti-Electrode Arrays by a Novel Atomic Force Microscopy Measurement Procedure and Their Fabrication by FIB Milling
 M.G. Jenke, Ch. Santschi and P. Hoffmann
 EPFL (Ecole Polytechnique Fédérale de Lausanne), CH
-TEM Studies of Iron Oxide Nanoparticles for Cell Labeling and Magnetic Separation
 A.L. Koh and R. Sinclair
 Stanford University, US
-Structural Analysis of Ptx-Pd1-x Nanoparticles Supported on amorphous Silica by High Resolution Electron Microscopy.
 N. Castillo, L. Diaz Barriga and R. Pérez
 UNAM, MX
-Real-Time In-Situ Measurement of Nanoparticle Size Distributions Using Electrical Mobility Technique
 M. Singh, E. Kathleen and B. Osmondson
 TSI Incorporated, US
-Quantitative Synchrotron Grazing Incidence X-ray Scattering Analysis of Cylindrical Nanostructure in Supported Thin Films
 J. Yoon, S.-Y. Yang, B. Lee, W.-C. Joo, K. Heo, J.K. Kim and M. Ree
 Pohang University of Science and Technology, KR
-Synchrotron X-Ray Scattering Studies of Star-Shape Polymers
 S. Jin, T. Higashihara, K.S. Jin, J. Yoon, K. Heo, J. Kim, K.-W. Kim, A. Hirao and M. Ree
 Pohang University of Science and Technology, KR
-Preparation and Characterization of Mn and Co substituted nano particle ZnO
 P. Venugopal Reddy, Y. Kalyana Lakshmi and K. Raju
 Osmania University, IN
-Characterization of Nanaoporous Low-Dielectric Constant SiCOH Films using Organosilane Precursor
 K. Heo, S.-G. Park, J. Yoon, K.S. Jin, S. Jin, S.-W. Rhee and M. Ree
 Pohang University of Science and Technology, KR
-Nanometre particle sizing and stability measurement with tabletop PCCS
 W. Laemmle
 Sympatec GmbH, DE
-In-plane Vibration Measurements of Micro Scale Devices Using Sub-Pixel Image Registration Algorithms and Stroboscopic Illumination
 T. Buyukyazi and I. Basdogan
 Koc University, TR
-Analysis of an Ink Ejection Failure on a MEMS Micro-Injector Printing Head
 I-Y Lee, T-P Hsu, F-C Tseng, H-K Tang and G-D Lin
 BenQ Corporation, TW
-Microstructure and Pile-up effect on Nanoindentation measurements of FCC and BCC Metals
 A.K. Srivastava and R.A. Mirshams
 University of North Texas, US
-Application of Abductive Network and FEM to Predict the Stress-Strain Curve with strain hardening effect of Bulk Metals by Nanoindentation test
 T.S. Yang, J.Z. Qiu and S.Y. Chang
 National Formosa University, TW
-Nano-mechanical testing of Novel bioactive carbon nanotubes/HAP nano particles composite coatings
 I. Singh and P. Allan
 Brunel University, UK
-MEMS Reliability Assessment Program – Progress to Date
 J.L. Zunino III and D.R. Skelton
 U.S. Army ARDEC, US
-Predicting the Positive Effects of Combined Metallurgical and Thermo-Mechanical Impacts on the Reliability of Solder Joint Interconnections
 F.M. Khoshnaw
 LU, UK
-Structural Analysis of Platinum Paladium Nanoparticles Supported on amorphous Silica by High Resolution Electron Microscopy.
 N. Castillo, L. Diaz Barriga and R. Pérez
 UNAM, MX
-Laser diffraction study of inverse opals
 A. Sinitskii, V. Abramova, T. Laptinskaya and Yu. Tretyakov
 Moscow State University, RU
-Invertible Polymers for the Stabilization of Nanoparticles
 A. Kohut, A. Voronov and W. Peukert
 Friedrich-Alexander-University of Erlangen-Nuremberg, DE
-Size Dependence Of Conjugation of Amyloid Beta Protein On Gold Colloidal Nanoparticles’ Surfaces
 D. Sri Hartati, W. Tsang, N.M. Briglio, J.E. MacCormac and K. Yokoyama
 The State University of New York at Geneseo, US
ISBN:1-4200-6376-6
Pages:768
Hardcopy:$139.95
 
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