Authors: P. Malinowski, D. Makowski, G. Jablonski and A. Napieralski
Affilation: Technical University of Lodz, Poland
Pages: 248 - 251
Keywords: single event effect, single event upset, Hamming codes, cyclic redundancy check, state machine, static random access memory, neutron radiation, nanotechnology, microelectronics
This paper presents a design of a radiation tolerant readout system for an SRAM-based neutron detector. The radiation tolerance has been achieved on the system level by applying Error Detection and Correction schemes. The constructed system concerns using state machines immune to Single Event Upsets induced by neutron radiation.