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 | Nanotech 2007 Vol. 3
Technical Proceedings of the 2007 NSTI Nanotechnology Conference and Trade Show, Volume 3
Chapter 3: Sensors & MEMS |
| | Design of Radiation Tolerant Readout System for an Integrated SRAM Based Neutron Detector | | Authors: | P. Malinowski, D. Makowski, G. Jablonski and A. Napieralski | | Affilation: | Technical University of Lodz, PL | | Pages: | 248 - 251 | | Keywords: | single event effect, single event upset, Hamming codes, cyclic redundancy check, state machine, static random access memory, neutron radiation, nanotechnology, microelectronics | | Abstract: | This paper presents a design of a radiation tolerant readout system for an SRAM-based neutron detector. The radiation tolerance has been achieved on the system level by applying Error Detection and Correction schemes. The constructed system concerns using state machines immune to Single Event Upsets induced by neutron radiation. | | ISBN: | 1-4200-6184-4 |
| Pages: | 732 |
| Hardcopy: | $199.99 |
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