Nano Science and Technology Institute - NSTI  
Nano Science and Technology Institute   Home | Subscribe | Site Map  
  ABOUT | COURSES | EVENTS | PUBLICATIONS | LEADERSHIP | OUTREACH | NEWS | PRESS | JOBS | Nanotechnology Solutions
px
px fade_top
Publications
Nanotech 2008 CDROM
Nanotech 2007 CDROM
Nanotech 2006 CDROM
Nanotech 2005 CDROM
Nanotech 2004 CDROM
3 CDROM Special Offer
Nanotech 2008 Vol. 1
Nanotech 2008 Vol. 2
Nanotech 2008 Vol. 3
Nanotech 2007 Vol. 1
Nanotech 2007 Vol. 2
Nanotech 2007 Vol. 3
Nanotech 2007 Vol. 4
Nanotech 2006 Vol. 1
Nanotech 2006 Vol. 2
Nanotech 2006 Vol. 3
Nanotech 2005 Vol. 1
Nanotech 2005 Vol. 2
Nanotech 2005 Vol. 3
WCM 2005
Nanotech 2004 Vol. 1
Nanotech 2004 Vol. 2
Nanotech 2004 Vol. 3
Nanotech 2003 Vol. 1
Nanotech 2003 Vol. 2
Nanotech 2003 Vol. 3
Nanotech 2002 Vol. 1
Nanotech 2002 Vol. 2
Nanotech 2001 Vol. 1
Nanotech 2001 Vol. 2
MSM 2000
MSM 99
MSM 98
Index of Authors
Index of Keywords
Index of Affiliations
Library Request Form
Shopping Cart
Order Form
 
Publications Publications
Nanotech 2007 Vol. 3
p
 
Technical Proceedings of the 2007 NSTI Nanotechnology Conference and Trade Show, Volume 3
Nanotech 2007 Vol. 3
Technical Proceedings of the 2007 NSTI Nanotechnology Conference and Trade Show, Volume 3
 
Chapter 2: MEMS/NEMS: Modeling & Characterization
 

A Method for Semi-Automated Modeling of Analog-Mixed Signal Systems in Automotive Applications based on Transient Simulation Data

Authors:H. Mielenz, R. Doelling and W. Rosenstiel
Affilation:Robert Bosch Group, DE
Pages:89 - 92
Keywords:behavioral modeling, analog mixed-signal sytems, circuits, support vector machine
Abstract:Functional verification by simulation is an important step during the development of present microelectronic solutions for automotive applications. Its relevance is based on the capability to compare the behavior of a developed circuit with its specification. Since the transient simulation of application specific integrated circuits (ASICs) normally shows long runtimes, the behavior of time-critical components is manually modeled in order to speed up simulation. The present article describes a data-based approach for semi-automated generation of behavioral models for analog mixed-signal (A/MS) systems. The approach is based on support vector machines and a transformation dictionary for extraction of dynamic properties. The application of this method results in highly accurate pin-compatible behavioral models for A/MS systems with a significant reduction in simulation times. Additionally, the generated models can be easily integrated in description languages like VDHL-AMS, Verilog-AMS, Simulink and MAST. Another benefit of the proposed method consists in its flexibility to model systems of different physical domains. The emphasized properties will be illustrated by the modeling of two examples belonging to analog-digital and electromechanic systems respectively.
ISBN:1-4200-6184-4
Pages:732
Hardcopy:$199.99
 
Order:Mail/Fax Form
Special:3 CD Set — 15% off with Free Shipping
Up
nanoPRwire™
nanoPRwire
News Headlines
nano World news
 
 
 
 
px
© Nano Science and Technology Institute     About NSTI | Terms of Use | Privacy Policy | Contact