Nano Science and Technology Institute - NSTI  
Nano Science and Technology Institute   Home | Subscribe | Site Map  
  ABOUT | COURSES | EVENTS | PUBLICATIONS | LEADERSHIP | OUTREACH | NEWS | PRESS | JOBS | Nanotechnology Solutions
px
px fade_top
Publications
Nanotech 2008 CDROM
Nanotech 2007 CDROM
Nanotech 2006 CDROM
Nanotech 2005 CDROM
Nanotech 2004 CDROM
3 CDROM Special Offer
Nanotech 2008 Vol. 1
Nanotech 2008 Vol. 2
Nanotech 2008 Vol. 3
Nanotech 2007 Vol. 1
Nanotech 2007 Vol. 2
Nanotech 2007 Vol. 3
Nanotech 2007 Vol. 4
Nanotech 2006 Vol. 1
Nanotech 2006 Vol. 2
Nanotech 2006 Vol. 3
Nanotech 2005 Vol. 1
Nanotech 2005 Vol. 2
Nanotech 2005 Vol. 3
WCM 2005
Nanotech 2004 Vol. 1
Nanotech 2004 Vol. 2
Nanotech 2004 Vol. 3
Nanotech 2003 Vol. 1
Nanotech 2003 Vol. 2
Nanotech 2003 Vol. 3
Nanotech 2002 Vol. 1
Nanotech 2002 Vol. 2
Nanotech 2001 Vol. 1
Nanotech 2001 Vol. 2
MSM 2000
MSM 99
MSM 98
Index of Authors
Index of Keywords
Index of Affiliations
Library Request Form
Shopping Cart
Order Form
 
Publications Publications
Nanotech 2007 Vol. 3
p
 
Technical Proceedings of the 2007 NSTI Nanotechnology Conference and Trade Show, Volume 3
Nanotech 2007 Vol. 3
Technical Proceedings of the 2007 NSTI Nanotechnology Conference and Trade Show, Volume 3
 
Chapter 2: MEMS/NEMS: Modeling & Characterization
 

Investigation of Vector Discretization Schemes for Box Volume Methods

Authors:O. Triebl and T. Grasser
Affilation:Christian Doppler Laboratory for TCAD in Microelectronics, AT
Pages:61 - 64
Keywords:vector discretization box method tcad
Abstract:The usage of the box integration method in Technology CAD environments is investigated. Focus is taken on methods how to discretize vectors in box volumes. The authors of this paper discuss three different methods for approximation of vector quantities within the box method. Impact ionization simulations using the drift-diffusion transport equations are used as example, because the current density vector and the electric field vector are needed for modeling. Simulation results of devices operated near break-down are presented, which commonly leads to bad convergence behavior. Advantages and disadvantages in respect to implementation, to errors, and to convergence behavior are presented.
ISBN:1-4200-6184-4
Pages:732
Hardcopy:$199.99
 
Order:Mail/Fax Form
Special:3 CD Set — 15% off with Free Shipping
Up
nanoPRwire™
nanoPRwire
News Headlines
nano World news
 
 
 
 
px
© Nano Science and Technology Institute     About NSTI | Terms of Use | Privacy Policy | Contact