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 | Nanotech 2006 Vol. 3
Technical Proceedings of the 2006 NSTI Nanotechnology Conference and Trade Show, Volume 3
Chapter 7: Compact Modeling |
| | A Unified Parameter Extraction Procedure for Scalable Bipolar Transistor Model Mextram | | Authors: | H-C Wu, S. Mijalkovic and J.N. Burghartz | | Affilation: | Delft university of technology, NL | | Pages: | 872 - 875 | | Keywords: | scalable Mextram model, unified parameter extraction, VHDL Verilog-A, SiGe HBT | | Abstract: | A unified parameters extraction procedure for temperature and geometry scalable bipolar transistor model Mextram has been demonstrated using an example of high-speed SiGe HBT technology. The essential feature of the proposed methodology is a direct extraction of the scaling parameters from the measured electrical characteristics and the model parameters are extracted only once for a single reference geometry. | | ISBN: | 0-9767985-8-1 |
| Pages: | 913 |
| Hardcopy: | $185.00 |
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