Thermal Noise and Bit Error Rate Limits in Nanoscale Memories
Authors:
L. Forbes, M. Mudrow and W. Wanalertlak
Affilation:
oregon state university, US
Pages:
78 - 81
Keywords:
noise, error rates, nanoscale memories
Abstract:
Analysis of the effects of thermal noise in nanoscale memories is presented. A theoretical analysis of thermal noise is used to predict the number of bit errors per year caused by thermal noise.
