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Nanotech 2006 Vol. 1
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Technical Proceedings of the 2006 NSTI Nanotechnology Conference and Trade Show, Volume 1
Nanotech 2006 Vol. 1
Technical Proceedings of the 2006 NSTI Nanotechnology Conference and Trade Show, Volume 1
 
Chapter 8: Characterization
 

Size-Dependent Elastic Moduli of Nanofilms

Authors:I-L Chang and J-C Huang
Affilation:National Chung Cheng University, TW
Pages:777 - 780
Keywords:nanofilm, elastic moduli, semi-continuum model, face-cubic-center crystal
Abstract:A semi-continuum model is constructed for the analysis of face-cubic-center crystal structure nanofilms to study the size dependence of the elastic properties. Unlike the classical continuum theory, the current model directly takes the discrete nature in the thickness direction into consideration. In-plane Young’s modulus, and in-plane and out-plane Poisson’s ratios are investigated with this model and it is found that the values of the elastic moduli (Young’s modulus and Poisson’s ratios) depend on the total number of atomic layers in the thickness direction and approaches the bulk value asymptotically.
ISBN:0-9767985-6-5
Pages:871
Hardcopy:$185.00
 
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