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 | Nanotech 2006 Vol. 1
Technical Proceedings of the 2006 NSTI Nanotechnology Conference and Trade Show, Volume 1
Chapter 8: Characterization |
| | New reference standards and artifacts for nanoscale property characterization | | Authors: | J.R. Pratt, J.A. Kramar, G. Shaw, R. Gates, P. Rice and J. Moreland | | Affilation: | National Institute of Standards and Technology, US | | Pages: | 764 - 767 | | Keywords: | atomic force microscope, cantilever, stiffness calibration | | Abstract: | This paper provides an overview of calibration artifacts being developed at NIST that will greatly aid the accurate determination of nanoscale physical properties across a broad range of applications. We focus on three proposed reference standards: a spring constant artifact for calibration of atomic force microscope cantilever stiffness, a piezoresistive force sensor for calibration of contact force in atomic force acoustic microscopy, and a torsional oscillator for the absolute measurement of thin-film magnetic moments. | | ISBN: | 0-9767985-6-5 |
| Pages: | 871 |
| Hardcopy: | $185.00 |
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