Brugger S.C., Schenk A.
Swiss Federal Institut of Technology, CH
Keywords: device simulation, generation-recombination, impact ionisation, Monte Carlo
A new one-particle Monte Carlo iteration scheme has been found to
self-consistently take into account generation-recombination
processes. The basic idea is to couple the BTE not only with the
Poisson equation, but also with the continuity equation by using the
exact transport coefficients from the MC simulation in high-field
regions and the known analytical transport coefficients in low-field
regions. This approach will be useful e.g. for the simulation of
floating body effects in nanoscale double- and multi-gate SOI MOSFETs.
Journal: TechConnect Briefs
Volume: 1, Technical Proceedings of the 2006 NSTI Nanotechnology Conference and Trade Show, Volume 1
Published: May 7, 2006
Pages: 673 - 676
Industry sector: Advanced Materials & Manufacturing
Topic: Informatics, Modeling & Simulation
ISBN: 0-9767985-6-5