Nano Science and Technology Institute - NSTI  
Nano Science and Technology Institute   Home | Subscribe | Site Map  
  ABOUT | COURSES | EVENTS | PUBLICATIONS | LEADERSHIP | OUTREACH | NEWS | PRESS | JOBS | Nanotechnology Solutions
px
px fade_top
Publications
Nanotech 2008 CDROM
Nanotech 2007 CDROM
Nanotech 2006 CDROM
Nanotech 2005 CDROM
Nanotech 2004 CDROM
3 CDROM Special Offer
Nanotech 2008 Vol. 1
Nanotech 2008 Vol. 2
Nanotech 2008 Vol. 3
Nanotech 2007 Vol. 1
Nanotech 2007 Vol. 2
Nanotech 2007 Vol. 3
Nanotech 2007 Vol. 4
Nanotech 2006 Vol. 1
Nanotech 2006 Vol. 2
Nanotech 2006 Vol. 3
Nanotech 2005 Vol. 1
Nanotech 2005 Vol. 2
Nanotech 2005 Vol. 3
WCM 2005
Nanotech 2004 Vol. 1
Nanotech 2004 Vol. 2
Nanotech 2004 Vol. 3
Nanotech 2003 Vol. 1
Nanotech 2003 Vol. 2
Nanotech 2003 Vol. 3
Nanotech 2002 Vol. 1
Nanotech 2002 Vol. 2
Nanotech 2001 Vol. 1
Nanotech 2001 Vol. 2
MSM 2000
MSM 99
MSM 98
Index of Authors
Index of Keywords
Index of Affiliations
Library Request Form
Shopping Cart
Order Form
 
Publications Publications
Nanotech 2006 Vol. 1
p
 
Technical Proceedings of the 2006 NSTI Nanotechnology Conference and Trade Show, Volume 1
Nanotech 2006 Vol. 1
Technical Proceedings of the 2006 NSTI Nanotechnology Conference and Trade Show, Volume 1
 
Chapter 4: Nanoparticle Processes & Applications
 

Synthesis and Electrical Characterization of Silicon Nanoparticles for Electronic Applications

Authors:D. Gopireddy, C.G. Takoudis, D. Gamota, J. Zhang and P.W. Brazis
Affilation:University of Illinois - Chicago, US
Pages:308 - 310
Keywords:silicon nanoparticles, electrical characterization, FETs
Abstract:In an effort to assess their potential for future nanoelectronic devices, we have fabricated silicon nanoparticles field effect transistors with nanoparticles as the active channel. The nanoparticles of 10-20 nm diameters are grown on a 200 nm gate oxide film on a highly p-doped silicon wafer, which is used as a back gate substrate. Source and drain contacts were fabricated using conventional lithography techniques. The nanoparticles used in this study were deposited on silicon dioxide substrate by thermal decomposition of silane using Low Pressure Chemical Vapor Deposition. This route offers an excellent control over particle size and size distribution and density by varying the process parameters. The goal of this study is to show the semiconducting nature of the nanoparticles and to characterize the performance of nanoparticle transistors. The source-drain current through the devices is measured at room temperature as a function of the bias voltage and the gate voltage. Based on the transfer characteristics obtained, the carrier density and the mobility of the charge carries are estimated. We will present the electrical characteristics of nanoparticles as a function of their density and size. The devices fabricated show good performance characteristics indicating potential for applications in nanoelectronics.
ISBN:0-9767985-6-5
Pages:871
Hardcopy:$185.00
 
Order:Mail/Fax Form
Special:3 CD Set — 15% off with Free Shipping
Up
Upcoming Events
Nanotech 2009
Cleantech 2009
BioNano 2009
TechConnect Summit
nanoPRwire™
nanoPRwire
News Headlines
nano World news
 
 
 
 
px
© Nano Science and Technology Institute     About NSTI | Terms of Use | Privacy Policy | Contact