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 | Nanotech 2005 Vol. 3
Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 3
Chapter 7: Smart Sensors and Systems |
| | The IAradSim – IA32 Architecture under a High Radiation Environment Simulator | | Authors: | B. Swiercz, D. Makowski and A. Napieralski | | Affilation: | Technical University of Lodz, PL | | Pages: | 411 - 414 | | Keywords: | single event upset, total ionising dose, radiation environment, IA-32 architecture, fault tolerant system, hardened | | Abstract: | Systems, which were designed for military or space applications, very often are exposed to increased radiation. The problem of designing hardened systems is very important for modern physics. The physics experiences design in linear accelerators and synchrotrons need measurements and control devices, which are under radiation impact. This paper highlights the application, which allows testing and observing systems intended to be used in a radioactive environment. The main aim of IAradSim is to reduce costs of research of hardened and fault tolerant systems. |  | View paper | | ISBN: | 0-9767985-2-2 |
| Pages: | 786 |
| Hardcopy: | $165.00 |
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