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Nanotech 2005 Vol. 3
Nanotech 2005 Vol. 3
Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 3
Chapter 11:
Modules and Circuits
-
Fault Tolerant Quantum Computation with new Reversible Gate
D.P. Vasudevan, P.K. Lala and J.P. Parkerson
University of Arkansas, Fayetteville, US
-
Nano Scale Autonomous Error-Tolerant (AET) Cellular Network
J. Liu, R. Weerasekera, L-R Zheng and H. Tenhunen
Royal Institute of Technology (KTH), SE
ISBN:
0-9767985-2-2
Pages:
786
Hardcopy:
$165.00
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3 CD Set — 15% off with Free Shipping
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