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 | Nanotech 2005 Vol. 2
Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 2
Chapter 7: NEMS and MEMS Fabrication |
| | Absolute Pressure Measurement using 3D-MEMS Technology | | Authors: | R. Russell and U. Meriheinä | | Affilation: | VTI Technologies, US | | Pages: | 511 - 514 | | Keywords: | capacitive pressure sensor, silicon MEMS sensor, high performance, barometric, altimeter, pressure, absolute, 3D-MEMS technology | | Abstract: | The use of 3D-MEMS processes has created yet another new breakthrough. Extremely small silicon capacitive absolute pressure sensors can now be realized by utilizing the same MEMS technology that has been in production for many years. The applications where absolute pressure measurement has not been possible due to size or current limitation can now be solved effectively. | | ISBN: | 0-9767985-1-4 |
| Pages: | 808 |
| Hardcopy: | $165.00 |
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