Authors: M. Pedeferri, C.E. Bottani, D. Cattaneo, A. Li Bassi, B. Del Curto, M.F. Brunella
Affilation: Politecnico di Milano, Italy
Pages: 332 - 334
Keywords: titanium, anatase, treatment, Raman Spectroscopy, XRD
Aim of the work has been the evaluation of the application of a novel treatment of the Ti surface in order to increase anatase growth. Two different anodizing methodologies, previously developed were considered, followed by a suitable post treatment able to convert the amorphous oxide film, obtained by anodizing, in a crystalline anatase structure. X ray thin film diffractometry and Raman spectroscopy were used to characterize six sample conditions: NA-NT Ti as received, NA-YT not anodized and heat treated, 1A-NT type 1 anodizing not heat treated, 1A-YT type 1 anodizing and heat treated, 2A-NT type 2 anodizing not heat treated, 2A-YT type 2 anodizing and heat treated. The better anatase crystallinity seems to be reached for the 1A-YT condition as shown by the higher intensity of the narrow anatase XRD peak and by Raman spectrum. In fact Raman spectrum of 2A-YT sample shows four anatase peaks but the most intense one is shifted towards higher frequencies and broadened, suggesting a crystallite dimension of tenth nanometers. Raman spectroscopy could give complementary informations to X ray diffraction analysis but the two analysis technique equally indicate that the treatment 1A followed by heat treatment could be applied to improve anatase growth on Ti surface.