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 | Nanotech 2005 Vol. 2
Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 2
Chapter 11: Characterization Tools and Microscopy |
| | Simultaneous Topography and RECognition Mapping with PicoTREC™: A Powerful New Technology That Can Be Used To Map Nanometer-Scale Molecular Binding Sites On A Variety Of Surfaces | | Authors: | W.T. Johnson, G. Kada, C. Stroh, H. Gruber, H. Wang, F. Kienberger, A. Ebner, S. Lindsay and P. Hinterdorfer | | Affilation: | Molecular Imaging, Corp., US | | Pages: | 679 - 682 | | Keywords: | single molecule, imaging, recognition, AFM, SPM | | Abstract: | PicoTRECTM is a new Topography and RECognition imaging solution that requires no fluorescence, radioactivity, enzyme-linked detection schemes or other extraneous labels. It combines real-time detection of molecular recognition events and single-molecule sensitivity with the imaging capability of AFM/SPM. PicoTREC allows a researcher to quickly determine where specific, single molecule binding interactions occur on a sample and resolves them from surface topography information. | | ISBN: | 0-9767985-1-4 |
| Pages: | 808 |
| Hardcopy: | $165.00 |
| Special: | 3 CD Set — 15% off with Free Shipping |
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| Order: | Mail/Fax Form |
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