Authors: J.S. Kulkarni, B. Daly, K.J. Ziegler, T. Crowley, D. Erts, B. Polyakov, M.A. Morris and J.D. Holmes
Affilation: University College Cork, Ireland
Pages: 627 - 629
Keywords: mesoporous silicas, anodized aluminium oxide, thin films, nanowires, conductive atomic force microscopy
We have prepared high-density, ordered arrays of semiconductor nanowires within the pores of mesoporous thin films (MTFs) and anodized aluminum oxide (AAO) matrices using a supercritical fluid solution-phase inclusion technique. Conductive atomic force microscopy (C-AFM) was utilized to study the electrical properties of the nanowires within these arrays. Nearly all of the semiconductor nanowires contained within the AAO substrates were found to possess similar electrical properties demonstrating that the nanowires are continuous and reproducible within each pore.