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 | Nanotech 2004 Vol. 3
Technical Proceedings of the 2004 NSTI Nanotechnology Conference and Trade Show, Volume 3
Chapter 9: Characterization and Parameter Extraction |
| | Mechanical Parameter Extraction of Thin-Film Coated Materials | | Authors: | Y. Li and K.K. Tseng | | Affilation: | Vanderbilt University, US | | Pages: | 437 - 440 | | Keywords: | Image Point nanoindentation, thin-film, image method, interface, distributed force | | Abstract: | Materials coated with thin-films have become popular in many advanced applications. The thin layer of high-strength coating can improve the performance of the material. However, challenges arise when characterizing or extracting mechanical parameters for this class of material due to the presence of one or multiple layers of coating. Experimental methods such as nanoindentation and scratch test can be used to determine the mechanical properties for a given specimen. This paper presents a modeling framework for predicting the mechanical property of thin-film coated materials based on the image method. Analytical closed-form expressions for the stress distribution on a coated material subjected to a distributed loading on the surface of the coating material are derived in recursive forms. These recursive equations are implemented numerically to calculate the solutions of the problem. Theses solutions can be used to validate the experimental results of nanoindentation and scratch tests. | | ISBN: | 0-9728422-9-2 |
| Pages: | 561 |
| Hardcopy: | $150.00 |
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