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 | Nanotech 2004 Vol. 3
Technical Proceedings of the 2004 NSTI Nanotechnology Conference and Trade Show, Volume 3
Chapter 4: Nano Devices and Systems |
| | Defects and Fault Characterization in Quantum Cellular Automata | | Authors: | M. Baradaran Tahoori, M. Momenzadeh, J. Huang and F. Lombardi | | Affilation: | Northeastern University, US | | Pages: | 190 - 193 | | Keywords: | quantum computing, nano systems and devices, defect characterization | | Abstract: | In this paper, a detailed simulation-based characterization of QCA defects and study of their effects at logic-level are presented. Different defect mechanisms for QCA active devices and interconnects are considered and the appropriate fault models at logic-level are investigated. Different implementations of QCA logic devices and interconnects are compared in term of defect tolerance and testability. | | ISBN: | 0-9728422-9-2 |
| Pages: | 561 |
| Hardcopy: | $150.00 |
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