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Nanotech 2004 Vol. 3
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Technical Proceedings of the 2004 NSTI Nanotechnology Conference and Trade Show, Volume 3
Nanotech 2004 Vol. 3
Technical Proceedings of the 2004 NSTI Nanotechnology Conference and Trade Show, Volume 3

Chapter 4:

Nano Devices and Systems

-Single Wall Carbon Nanotube-Based Structural Health Monitoring Sensing Materials
 A.N. Watkins, J.L. Ingram, J.D. Jordan, R.A. Wincheski, J.M. Smits and P.A. Williams
 NASA Langley Research Center, US
-Scanning Probe Lithography on InAs Substrate
 L.F. Houlet, H. Yamaguchi and Y. Hirayama
 NTT Basic Research Laboratories, NTT Corporation, JP
-A New Wet Chemical Approach to the Selective Synthesis of Silver Nanowires
 E.A. Hernandez, B. Posada, R. Irizarry and M.E. Castro
 The University of Puerto Rico, US
-Thermal Noise Response Based Static Non-Contact Atomic Force Microscopy
 A. Gannepalli, A. Sebastian, M.V. Salapaka and J. Cleveland
  Iowa State University, US
-Metal-Insulator-Metal Ensemble (MIME) Chemical Detectors
 R.R. Smardzewski, N.L. Jarvis, A.W. Snow, H. Wohltjen and R.A. Mackay
 Edgewood Chemical Biological Center, U.S. Army SBCCOM, US
-Silicon Nanostructures Patterned on SOI by AFM Lithography
 I. Ionica, L. Montès, S. Ferraton, J. Zimmermann, V. Bouchiat and L. Saminadayar
 IMEP-INPGrenoble, GF
-On the Design of SET Adders
 M. Sulieman and V. Beiu
 Washington State University, US
-In Situ Transformations of Gold Contacts Studied by Moleculad Dynamics Simulations
 A.V. Pokropivny, A. Lõhmus, R. Lõhmus, D. Erts, V.V. Pokropivny and H. Olin
 University of Latvia, EE
-Development of the Nano Aligner for CNT-tip fabrication
 G-S Kang, J-S Lee, J-S Choi, Y-K Kwak and S-H Kim
 KAIST, KR
-Nano Gripper using Carbon Nanotube
 J-S Lee, S-K Kwon, J-S Choi, G-S Kang, Y-K Kwak, S-H Kim
 KAIST, KR
-Displacement Detection using Quantum Mechanical Electron Tunneling in Micro and Nano-electro-mechanical Systems
 D. Taylor and K. Ekinci
 Boston University, US
-A Nanoscale Electromechanical Contact Switch for Logic Applications
 C.C. Huang and K.L. Ekinci
 Boston University, US
-Defects and Fault Characterization in Quantum Cellular Automata
 M. Baradaran Tahoori, M. Momenzadeh, J. Huang and F. Lombardi
 Northeastern University, US
-Investigation of Robust Fully-Silicided NMOSFETs for Sub-100 nm ESD Protection Circuits Design
 J-W Lee, H. Tang and Y. Li
 Natl Nano Device Labs & Natl Chiao Tung Univ, TW
ISBN:0-9728422-9-2
Pages:561
Hardcopy:$150.00
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