 | Nanotech 2004 Vol. 3
Technical Proceedings of the 2004 NSTI Nanotechnology Conference and Trade Show, Volume 3
Chapter 11: Commercial Tools, Processes and Materials |
| - | Miniaturized High Speed Visualization Setup for the Diagnostics of Dynamical Processes in Microsystems |
| | H. Brugger, C. Maier and E.P. Hofer |
| | University of Ulm, DE |
| - | Atomic Holographic Optical Storage Nanotechnology |
| | M.E. Thomas |
| | Colossal Storage Corp., US |
| - | Cooling and Power Conversion using Nanometer Gaps |
| | A. Tavkhelidze and I. Cox |
| | Cool Chips plc, UK |
| - | Novel Approach to Circuit Board Testing |
| | R.G. Wright, L.V. Kirkland, M. Zgol, D. Adebimpe, E. Keenan and R. Mulligan |
| | GMA Industries, Inc., US |
| - | Anticipating the Public Backlash: Public Relations Lessons for Nanotechnology from the Biotechnology Experience |
| | J.H. Matsuura |
| | University of Dayton School of Law, US |
| - | Enabling Nanofabrication through Dip Pen Nanolithography™ |
| | R. Eby and J. Leckenby |
| | NanoInk Inc, US |
| - | Nanocrystalline Mixed Metal Oxides Novel Oxygen Storage Materials |
| | H. Sarkas, P.G. Murray, A. Fay and R.W. Brotzman_Jr. |
| | Nanophase Technologies Corporation, US |
| - | Realizing Complex Microsystems: A Deterministic Parallel Assembly Approach |
| | J. Randall, G. Hughes, A. Geisberger, K. Tsui, R. Saini, M. Ellis and G. Skidmore |
| | Zyvex Corporation, US |
| - | A Novel X-ray Microtomography System with High Resolution and Throughput |
| | Y. Wang, F. Duewer, S. Kamath, D. Scott and W. Yun |
| | Xradia, Inc., US |
| - | Step and Repeat UV Imprint Process Technology for Wafer-Scale Nano-Manufacturing |
| | M. Watts, V. Truskett, J. Choi, C. Mackay, I. McMackin, P. Schumaker, D. Babbs, S.V. Sreenivasan and N. Schumaker |
| | Molecular Imprints, Inc, US |
| - | A New Semiconductor-Wafer Market Based on the Deepening of Surface Undulations to Form Strongly Textured Atomic Ridges (STAR) With Pitches from 0.6 to 5.4 nm: Model Demonstrations in Electronics and the Physical and Life Sciences |
| | D.L. Kendall and M. Kendall |
| | StarMega Corp, US |
| - | Leveraging Mainstream Design and Analysis Tools for MEMS |
| | I. Mirman and D.C. Flanders |
| | SolidWorks Corporation, US |
| - | UV Laser Micro-Materials Processing Of MEMS, Microfluidics, Sensors, LEDs and Other Miniature Devices |
| | J.P. Sercel |
| | JP Sercel Associates, Inc., US |
| - | Local Electrode Atom Probes for 3-D Metrology |
| | T. Kelly, T. Gribb, J. Olson, R. Martens, J. Shepard, S. Wiener, T. Kunicki, R. Ulfig, D. Lenz, E. Strennen, E. Oltman, J. Bunton and D. Strait |
| | Imago Scientific Instruments Corp., US |
| - | Nanoinformatics: Emerging Computational Tools in Nano-scale Research |
| | K. Ruping and B.W. Sherman |
| | Fellow, MIT, US |
| - | NANOPOLIS: An Infrastructure for Communication in the Nanotech World |
| | D. Bog and F. Ciontu |
| | iMediasoft Group, FR |
| ISBN: | 0-9728422-9-2 |
| Pages: | 561 |
| Hardcopy: | $79.95 |
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| Order: | Mail/Fax Form |
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