Nano Science and Technology Institute
Nanotech 2004 Vol. 3
Nanotech 2004 Vol. 3
Technical Proceedings of the 2004 NSTI Nanotechnology Conference and Trade Show, Volume 3

Chapter 11:

Commercial Tools, Processes and Materials

-Miniaturized High Speed Visualization Setup for the Diagnostics of Dynamical Processes in Microsystems
 H. Brugger, C. Maier and E.P. Hofer
 University of Ulm, DE
-Atomic Holographic Optical Storage Nanotechnology
 M.E. Thomas
 Colossal Storage Corp., US
-Cooling and Power Conversion using Nanometer Gaps
 A. Tavkhelidze and I. Cox
 Cool Chips plc, UK
-Novel Approach to Circuit Board Testing
 R.G. Wright, L.V. Kirkland, M. Zgol, D. Adebimpe, E. Keenan and R. Mulligan
 GMA Industries, Inc., US
-Anticipating the Public Backlash: Public Relations Lessons for Nanotechnology from the Biotechnology Experience
 J.H. Matsuura
 University of Dayton School of Law, US
-Enabling Nanofabrication through Dip Pen Nanolithography™
 R. Eby and J. Leckenby
 NanoInk Inc, US
-Nanocrystalline Mixed Metal Oxides Novel Oxygen Storage Materials
 H. Sarkas, P.G. Murray, A. Fay and R.W. Brotzman_Jr.
 Nanophase Technologies Corporation, US
-Realizing Complex Microsystems: A Deterministic Parallel Assembly Approach
 J. Randall, G. Hughes, A. Geisberger, K. Tsui, R. Saini, M. Ellis and G. Skidmore
 Zyvex Corporation, US
-A Novel X-ray Microtomography System with High Resolution and Throughput
 Y. Wang, F. Duewer, S. Kamath, D. Scott and W. Yun
 Xradia, Inc., US
-Step and Repeat UV Imprint Process Technology for Wafer-Scale Nano-Manufacturing
 M. Watts, V. Truskett, J. Choi, C. Mackay, I. McMackin, P. Schumaker, D. Babbs, S.V. Sreenivasan and N. Schumaker
 Molecular Imprints, Inc, US
-A New Semiconductor-Wafer Market Based on the Deepening of Surface Undulations to Form Strongly Textured Atomic Ridges (STAR) With Pitches from 0.6 to 5.4 nm: Model Demonstrations in Electronics and the Physical and Life Sciences
 D.L. Kendall and M. Kendall
 StarMega Corp, US
-Leveraging Mainstream Design and Analysis Tools for MEMS
 I. Mirman and D.C. Flanders
 SolidWorks Corporation, US
-UV Laser Micro-Materials Processing Of MEMS, Microfluidics, Sensors, LEDs and Other Miniature Devices
 J.P. Sercel
 JP Sercel Associates, Inc., US
-Local Electrode Atom Probes for 3-D Metrology
 T. Kelly, T. Gribb, J. Olson, R. Martens, J. Shepard, S. Wiener, T. Kunicki, R. Ulfig, D. Lenz, E. Strennen, E. Oltman, J. Bunton and D. Strait
 Imago Scientific Instruments Corp., US
-Nanoinformatics: Emerging Computational Tools in Nano-scale Research
 K. Ruping and B.W. Sherman
 Fellow, MIT, US
-NANOPOLIS: An Infrastructure for Communication in the Nanotech World
 D. Bog and F. Ciontu
 iMediasoft Group, FR
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