Nano Science and Technology Institute - NSTI  
Nano Science and Technology Institute   Home | Subscribe | Site Map  
  ABOUT | COURSES | EVENTS | PUBLICATIONS | LEADERSHIP | OUTREACH | NEWS | PRESS | JOBS | Nanotechnology Solutions
px
px fade_top
Publications
Nanotech 2007 CDROM
Nanotech 2006 CDROM
Nanotech 2005 CDROM
Nanotech 2004 CDROM
3 CDROM Special Offer
Nanotech 2007 Vol. 1
Nanotech 2007 Vol. 2
Nanotech 2007 Vol. 3
Nanotech 2007 Vol. 4
Nanotech 2006 Vol. 1
Nanotech 2006 Vol. 2
Nanotech 2006 Vol. 3
Nanotech 2005 Vol. 1
Nanotech 2005 Vol. 2
Nanotech 2005 Vol. 3
WCM 2005
Nanotech 2004 Vol. 1
Nanotech 2004 Vol. 2
Nanotech 2004 Vol. 3
Nanotech 2003 Vol. 1
Nanotech 2003 Vol. 2
Nanotech 2003 Vol. 3
Nanotech 2002 Vol. 1
Nanotech 2002 Vol. 2
Nanotech 2001 Vol. 1
Nanotech 2001 Vol. 2
MSM 2000
MSM 99
MSM 98
Index of Authors
Index of Keywords
Index of Affiliations
Library Request Form
Shopping Cart
Order Form
 
Publications Publications
Nanotech 2003 Vol. 2
p
 
Technical Proceedings of the 2003 Nanotechnology Conference and Trade Show, Volume 2
Nanotech 2003 Vol. 2
Technical Proceedings of the 2003 Nanotechnology Conference and Trade Show, Volume 2
 
Chapter 7: Compact Modeling
 

Unified RLC Model for On-Chip Interconnects

Authors:S-P. Sim and C. Yang
Affilation:Santa Clara University, US
Pages:356 - 359
Keywords:on-chip interconnects, compact modeling, capacitance, inductance
Abstract:We present a unified RLC model for deep sub-micron on-chip interconnects. The model consists of two components, a quasi-3D capacitance extraction based on a novel concept of "effective width" and a effective loop inductance model. In the quasi-3D capacitance model, the effective width provides and efficient way to decompose any 3D structure into a series of 2D segments, resulting in an accurate capacitance extraction. Validation and extraction methodology for the effective loop inductance, which is more computationally efficient than the partial inductance approach, will be addressed. Random capacitive coupling effect, which is important at high frequencies, will be investigated through a full-wave solver and S-parameter analysis, leading to a frequency-dependent RLC model valid up to 100 GHz.
Unified RLC Model for On-Chip InterconnectsView paper
ISBN:0-9728422-1-7
Pages:600
Special:3 CD Set — 15% off with Free Shipping
Up
Upcoming Events
Nanotech 2008
Cleantech 2008
BioNano 2008
TechConnect Summit
nanoPRwire™
nanoPRwire
News Headlines
nano World news
 
 
 
 
px
© Nano Science and Technology Institute     About NSTI | Terms of Use | Privacy Policy | Contact